What are the signals used to distinguish the elemental analysis instruments from scanning electron microscopy and transmission electron microscopy?
The elements that carry out elemental analysis are the elemental features emitted by the active region, X ray, auger electron,Characteristic energy loss electrons, such as cathode fluorescence, backscattered electrons, etc..
TEM often uses characteristic x rays and characteristic energy loss electrons,
SEM often use: EDS, WDS X - ray spectroscopic features; Auger electron need ultra high vacuum environment, often appear in Auger electron spectroscopy products, can also be included in the scanning electron microscope category; contrast backscattered electrons carry different domains average atomic number regions, atomic number height or the material density distribution of the qualitative solution cathode; fluorescence spectra in the ultraviolet range, electromagnetic radiation emitted visible or infrared wavelengths, this phenomenon can be used to detect minerals, trace elements and semiconductor in biological samples (ppm level, X ray spectrum WDS or X ray EDS can not achieve) distribution.
